Optical parameter measuring with temperature assignment
US6797927B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 19, 2003 |
| Grant date | Sep 28, 2004 |
| Priority date | — |
| Expiry date | Aug 19, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a measuring system adapted for providing a measurement of an optical parameter of an optical device under test —DUT—, comprising a measuring instrument adapted to perform the measurement and to provide a measurement signal comprising a plurality of values of the measured optical parameter of the DUT over the time.To improve the measurement the measuring system is adapted to receive a temperature signal comprising a plurality of values of the measured temperature of the DUT over the time, and to provide an output signal wherein values of the measured temperature are associated to such values of the measured optical parameter of the DUT that correspond in time.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.