Migration measuring method and measuring apparatus
US6798222B2 · kind B2 · utility
4Cited by
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20Claims
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Key dates
| Filing date | Jul 30, 2002 |
| Grant date | Sep 28, 2004 |
| Priority date | — |
| Expiry date | Mar 20, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N17/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A migration measuring method based on an alternating current impedance method, including steps: direct current with fine alternating current superposed is applied across electrodes (1), (2) to measure the impedance there between; and a surface static capacity (c) is calculated from the measured value of impedance in order to measure migration in accordance with the variation of the calculated surface static capacity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.