Test methods, systems, and probes for high-frequency wireless-communications devices
US6798223B2 · kind B2 · utility
131Cited by
21References
27Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 29, 2000 |
| Grant date | Sep 28, 2004 |
| Priority date | — |
| Expiry date | Nov 29, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06772
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test probe for a high-frequency device having an electronic circuit with two or more contact regions. The test probe comprises two or more signal probe tips. Each signal probe tip has a contact surface area for contacting one of the contact regions of the device. A ground probe has a ground contact surface with a surface area substantially greater than the contact surface area of the one signal probe tip for contacting another one of the contact regions of the electronic circuit. The ground probe is positioned between at least two of the signal probes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.