Methods and apparatus for providing signal dependent offset and gain adjustments for a solid state X-ray detector
US6798864B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 28, 2002 |
| Grant date | Sep 28, 2004 |
| Priority date | — |
| Expiry date | Feb 5, 2023 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/583
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Methods and apparatus are provided in a diagnostic X-ray system for reducing signal conversion time for a solid-state detector panel of the X-ray system in order to increase frame rate. A measurement of a set of induced signal offsets caused by time varying charge retention associated with the detector panel is performed during a phantom time segment prior to normal signal readout of the detector panel for a current image frame. A set of adjustment values is generated in response to the set of induced signal offsets. Subsets of signal values of the detector panel are read out to a pre-determined signal dynamic range as part of normal signal readout of the detector panel in response to the set of adjustment values, thus generating a set of normalized detector signals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.