Spectroscopic method for analyzing isotopes by using a semiconductor laser
US6800855B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 27, 1999 |
| Grant date | Oct 5, 2004 |
| Priority date | — |
| Expiry date | Dec 27, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/3504
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides a spectroscopic method for analyzing isotopes which makes it possible to simplify a system for measurement and to identify isotopes with high accuracy and sensitivity and to carry out quantitative analysis. The spectroscopic method for analyzing isotopes uses a semiconductor laser beam having as a wavelength zone a 2000 nm-wavelength band as a beam source of wavelengths of the absorption spectra of the isotopes. A reference gas is used for identification of the isotopes where the gas contains collating components having two wavelengths (W1, W2) of well-known absorption spectra in wavelength bands close to the wavelengths (w1, w2) of the absorption spectra of the isotopes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.