Patent · US Expired

Multiple-bit memory latch cell for integrated circuit gate array

US6800882B2 · kind B2 · utility

4Cited by
1References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 28, 2003
Grant dateOct 5, 2004
Priority date
Expiry dateMar 1, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/907
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A gate array integrated circuit is provided, which includes first and second voltage supply rails and a row of P-channel type transistors and adjacent N-channel type transistors located between first and second voltage supply rails. Adjacent ones of the P-channel and N-channel transistors have common control terminals. A multiple-bit memory cell is fabricated in the row and includes first and second latches, a read output, a first pass gate coupled between the first latch and the read output, and a second pass gate coupled between the second latch and the read output. The first pass gate includes a first one of the P-channel or N-channel transistors. The second pass gate includes a second one of the same type of the P-channel or N-channel transistors. The first and second same type transistors share a common diffusion region.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.