Patent · US Expired

Switching device provided with integrated test means

US6801081B2 · kind B2 · utility

1Cited by
2References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 19, 2002
Grant dateOct 5, 2004
Priority date
Expiry dateFeb 13, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04L49/101
  • WIPO fieldDigital communication
  • WIPO sectorElectrical engineering

Abstract

The invention relates to a switching device comprising a matrix having connection points and integrated test means comprising two pairs of generators/detectors which are pairwise controlled in such a way that the transmission paths traversed by the RF test signals from the generators to the associated inputs of the matrix and from the outputs of the matrix and to the associated detector are of the order of length of a single side of the switching matrix.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.