Patent · US Expired

Dimension-measuring column and method for entering a command to switch the measure mode in such a column

US6802133B2 · kind B2 · utility

42Cited by
19References
26Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 28, 2001
Grant dateOct 12, 2004
Priority date
Expiry dateMay 23, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05B2219/36433
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Method enabling a command to switch the measure mode to be entered in a single vertical axis dimension-measuring column. The mode witch command is entered by pressing the probe tip against the piece to be measured during a time interval greater than a predetermined value. The measuring and displaying system then engages in a search mode of the turn-back point of said piece to be measured.Application: measurement of inner or outer diameters by means of a single-axis measuring column. The method allows the hole's minimal and maximal points to be determined with a minimum of handling operations.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.