System and method for acquiring tie-point location information on a structure
US6804380B1 · kind B1 · utility
14Cited by
12References
34Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 18, 2000 |
| Grant date | Oct 12, 2004 |
| Priority date | — |
| Expiry date | May 18, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S17/89
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method are described for acquiring tie-point target locations on a structure that eliminates the need for the user to manually identify features that can be used to register multiple scenes so that they share a single coordinate system. In the present invention, readily identifiable objects, known as targets, are placed on or near the structure. When the structure is scanned, the targets are identified and can then be used in other operations, such as registration.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.