Patent · US Expired

Measurement of transparent container sidewall thickness

US6806459B1 · kind B1 · utility

14Cited by
14References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 30, 2001
Grant dateOct 19, 2004
Priority date
Expiry dateJul 15, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B11/0691
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Apparatus for measuring sidewall thickness of a container includes a conveyor for moving the container transversely of its axis through an inspection station and simultaneously rotating the container about its axis. A light source and an illumination lens system direct onto the sidewall of the container a line-shaped light beam having a long dimension perpendicular to the axis of the container and parallel to the direction of movement of the container through the inspection station. A light sensor and an imaging lens system direct onto the sensor light energy reflected from portions of the outer and inner sidewall surfaces that are perpendicular to the illumination light energy. An information processor is responsive to light energy directed onto the light sensor by the imaging lens system for determining the thickness of the container between the outer and inner sidewall surfaces.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.