Patent · US Expired

Non-volatile semiconductor memory device

US6807097B2 · kind B2 · utility

43Cited by
16References
27Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 15, 2003
Grant dateOct 19, 2004
Priority date
Expiry dateSep 15, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2211/5634
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A non-volatile semiconductor memory device includes: an array of electrically rewritable nonvolatile data storage memory cells each having a transistor structure with a control gate; reference current source circuit configured to generate a first reference current adaptable for use during an ordinary read operation and a second reference current for use during a verify-read operation for data status verification in one of writing and erasing events; a sense amplifier configured to compare read currents of a selected memory cell as selected during the ordinary read operation and the verify-read operation with the first and second reference currents respectively to thereby perform data detection; and a driver configured to give an identical voltage to the control gate of the selected memory cell presently selected during the ordinary read operation and the verify-read operation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.