Patent · US Expired

Measurement apparatus and process for determining the position of an object relative to a reference surface

US6807845B2 · kind B2 · utility

6Cited by

8References

18Claims

0Family size

Assignee

IFM Electronic GmbH · US

Inventors

Lorenz Halbinger · Leutkirch im Allgäu, DE
Benno Kathan · Günzburg, DE
Alfred Wagner

Key dates

Filing date	Oct 15, 2002
Grant date	Oct 26, 2004
Priority date	—
Expiry date	Oct 15, 2022

Classification

Technology area (CPC G)Physics
CPC primaryG01B13/00
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A measurement apparatus for determining the position of an object relative to a reference surface, with a measurement nozzle, a reference nozzle, and a measurement device, the outlet opening of the measurement nozzle being located in the reference surface. A compressed air source provides air having a certain feed pressure so that the measurement device acquires one of three state variables: flow rate, pressure and speed of the air upstream of the measurement nozzle.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.