Notched electrical test probe tip
US6809535B2 · kind B2 · utility
19Cited by
22References
12Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 10, 2003 |
| Grant date | Oct 26, 2004 |
| Priority date | — |
| Expiry date | Apr 30, 2023 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/49222
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An electrical test probe tip capable of establishing an electrical connection to test objects on a circuit board and particularly to rounded or irregularly shaped test objects preferably is a probing tip with a longitudinal planar axis and two planar contact surfaces. The contact surfaces substantially form an inverted “V” from the longitudinal planar axis when viewed from either side of the probing tip. The probing tip has a notch defined therein when viewed from both the front and the back. Optionally the preferred embodiment may have an exterior insulating coating.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.