Patent · US Expired

Ferroelectric capacitor, process for manufacturing thereof and ferroelectric memory

US6812510B2 · kind B2 · utility

7Cited by
6References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 21, 2003
Grant dateNov 2, 2004
Priority date
Expiry dateFeb 21, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D1/682
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A ferroelectric capacitor having a ferroelectric layer and a pair of electrodes, in which the ferroelectric layer contains carbon or carbon atoms of 5×1018 cm−3 or less, and the pair of electrodes is formed by a MOCVD (Metal Organic Chemical Vapor Deposition) method. A process for manufacturing a ferroelectric capacitor having the steps of forming a ferroelectric layer on one of a pair of electrodes; heating the layer at a temperature higher than when forming the layer, and to form the other electrode on the ferroelectric layer, or the steps of forming a ferroelectric layer on one of a pair of electrodes; forming the other electrode on the ferroelectric layer; and heating the layer at a temperature higher than when forming the layer to form the other electrode on the ferroelectric layer, to control carbon atoms of the ferroelectric layer to be 5×1018 cm−3 or less.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.