Apparatus for collecting signal measurement data at signal ports of an RF and microwave device-under-test, under different impedance load conditions
US6812714B2 · kind B2 · utility
18Cited by
2References
11Claims
0Family size
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Key dates
| Filing date | Sep 24, 2002 |
| Grant date | Nov 2, 2004 |
| Priority date | — |
| Expiry date | Sep 28, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2822
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for collecting RF signal measurement data at signal ports of an RF and microwave device-under-test (DUT). The apparatus comprises means for measuring incident and reflected RF signals at the signal ports of the DUT. Synthesizer means for generating RF signals at a fundamental frequency and higher harmonics. Tuner means arranged for loading the DUT under different impedance conditions for the fundamental frequency and higher harmonics, and means for feeding the RF signals of the synthesizer means to the signal ports of the DUT. The apparatus may form part of a Non-linear Network Measurement System (NNMS).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.