Patent · US Expired

Apparatus and method for built-in self-test of a data communications system

US6816987B1 · kind B1 · utility

41Cited by
11References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 25, 2000
Grant dateNov 9, 2004
Priority date
Expiry dateMar 25, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04B17/20
  • WIPO fieldTelecommunications
  • WIPO sectorElectrical engineering

Abstract

The present invention comprises an apparatus and corresponding method for performing a built-in self-test (BIST) of a data communications system. The apparatus of the invention includes a transmitter, a receiver coupled to the transmitter and a test control system coupled to the transmitter and receiver for measuring a data error rate of the data communications system. The transmitter, receiver and test control system are disposed on a common substrate, such as an integrated circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.