Patent · US Expired

Extraction of interconnect parasitics

US6819123B2 · kind B2 · utility

2Cited by
1References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 8, 2002
Grant dateNov 16, 2004
Priority date—
Expiry dateAug 8, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/3016
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The apparatus for detecting the effects of interconnect resistance and capacitance (RC) in a logic circuit includes a first ring oscillator with the interconnect RC parasitics in a logic circuit and a minimum reference ring oscillator without the interconnect RC parasitic in a logic circuit multiplexed to have common stages to obtain delay with and without the parasitics of the interconnect RC. The frequency difference between the first ring oscillator frequency and the minimum reference ring oscillator frequency is determined to detect the effects of the interconnect RC in the logic circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.