Patent · US Expired

Technique for fabricating high quality optical components

US6819438B2 · kind B2 · utility

3Cited by
10References
41Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 3, 2002
Grant dateNov 16, 2004
Priority date
Expiry dateNov 27, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B11/0625
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

To determine the uniformity of an optical component, a light beam is directed to impinge on a surface of an optical component at each of multiple points. A characteristic of the light beam impinging on the optical component surface at each of the multiple points is modified so as to have multiple different values. Light from the impinging light beam that passes through the optical component at each of the multiple points, with the light beam characteristic at each of the multiple different values, is detected. The non-uniformity of the optical component is determined based on the detected passing light.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.