Method for circuit recovery from overstress conditions
US6819539B1 · kind B1 · utility
33Cited by
34References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 20, 2001 |
| Grant date | Nov 16, 2004 |
| Priority date | — |
| Expiry date | Aug 20, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F1/28
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for circuit recovery from overstress conditions, comprising the steps of (A) detecting an event and (B) resetting a device when the event is a first predetermined type and providing recovery when the event is a second predetermined type.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.