Patent · US Expired

Tunnel-junction structures and methods

US6821848B2 · kind B2 · utility

0Cited by
3References
53Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 30, 2002
Grant dateNov 23, 2004
Priority date
Expiry dateNov 22, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2213/76
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Tunnel-junction structures are fabricated by any of a set of related methods that form two or more tunnel junctions simultaneously. The fabrication methods disclosed are compatible with conventional CMOS fabrication practices, including both single damascene and dual damascene processes. The simultaneously formed tunnel junctions may have different areas. In some embodiments, tub-well structures are formed with sloped sidewalls. In some embodiments, an oxide-metal-oxide film stack on the sidewall of a tub-well is etched to form the tunnel junctions. Memory circuits, other integrated circuit structures, substrates carrying microelectronics, and other electronic devices made by the methods are disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.