Patent · US Expired

Active differential test probe with a transmission line input structure

US6822463B1 · kind B1 · utility

78Cited by
22References
26Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 30, 2002
Grant dateNov 23, 2004
Priority date
Expiry dateOct 28, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/06772
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An active differential test probe with a transmission line input structure. The test probe includes a differential amplifier, a plurality of transmission line signal conductors that are coupled between the differential amplifier and test points where electrical signals can be sampled, and a plurality of transmission line ground conductors that are coupled to the differential amplifier and floating at their opposite end.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.