Patent · US Expired

Clock distribution system for automatic test equipment

US6822498B1 · kind B1 · utility

4Cited by
5References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 12, 2003
Grant dateNov 23, 2004
Priority date
Expiry dateJun 12, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31908
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A clock system for providing a high-speed clock signal to a plurality of integrated circuits is disclosed. The clock system includes an analog signal generator for producing a periodic analog signal of a predetermined frequency and fanout circuitry. The fanout circuitry is coupled to the analog signal generator and includes a transmission line and an RF coupler. The system further includes a plurality of receivers. Each receiver has reference signal input circuitry and clock signal input circuitry. Both the reference signal circuitry and the clock signal circuitry are receptive to coupling locally generated common mode noise. The clock signal circuitry is disposed proximate the RF coupler to provide an RF coupling therebetween.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.