Grasping system for automated exchange of elongated samples in an X-ray analysis apparatus
US6823041B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 8, 2002 |
| Grant date | Nov 23, 2004 |
| Priority date | — |
| Expiry date | Feb 20, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/20025
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray analysis apparatus for investigating material samples, comprising a device for automatic exchange of the samples (1), which comprises a gripping device (4) for precise removal of any desired sample (1) from a depositing position (3) and for transfer into a transfer and/or measuring position and back to a depositing position (3), wherein at least some of the samples are surrounded by a sample holder (13;13′) in the peripheral direction, is characterized in that the samples or containers containing the samples project past the sample holder in the vertical z direction perpendicular to the horizontal x-y plane and that the gripping device is disposed and structured on a side of the sample to surround parts of a sample or of a sample container which project past the sample holder in an operating position in the z direction and to grasp the sample holder. This allows, with minor and technically simple modifications, automatic processing of a plurality of samples in an X-ray analysis apparatus of this type including samples which are considerably elongated in the z direction.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.