Patent · US Expired

Device for examining samples

US6823079B1 · kind B1 · utility

12Cited by
6References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 27, 2001
Grant dateNov 23, 2004
Priority date
Expiry dateFeb 27, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N35/028
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An arrangement for examination of one or more specimens arranged in specimen vessels or on specimen carriers by transmitted light or incident light by imaging and/or detecting at least a portion of the specimen volume through the specimen vessel or specimen carrier by a CCD camera followed by an evaluating unit, wherein, advantageously, an incident illumination is likewise effected through the specimen vessel or specimen carrier and the illumination is used to excite specimen emission, preferably fluorescence excitation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.