Method and apparatus for positional calibration of a thermal analysis instrument
US6823278B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 9, 2003 |
| Grant date | Nov 23, 2004 |
| Priority date | — |
| Expiry date | Dec 9, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/346
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention is directed to a technique for performing calibration of an automatic sampler device. According to an aspect, the automatic sampler device includes a cell with a sample platform and a reference platform; a sample arm; a sample tray, and a platen. The sample tray includes wells into which pans are inserted. The platen may include conductive and/or reflective areas for calibration. The sample arm has an electronic sensor and an optical sensor. The electrical sensor and the optical sensor are used to calibrate the positions of one or more of: the sample platform, the reference platform, and a well. According to another aspect, autocalibration is optimized by adjusting autocalibration results with a set of stored offset coefficients. The offset coefficients are generated by performing a manual calibration. The difference between the results of the manual calibration and an autocalibration are stored as offset coefficients. The offset coefficients can be applied to subsequent autocalibrations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.