X-ray analysis apparatus
US6826253B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 8, 2002 |
| Grant date | Nov 30, 2004 |
| Priority date | — |
| Expiry date | Feb 20, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray analysis apparatus for investigating material samples, comprising a device for automatic exchange of the samples (1), which comprises a sample table (2) with depositing positions (3) disposed in m lines, wherein the lines extend parallel to an x direction and m≧2, and comprising a gripping device (4) for precise removal of any desired sample (1) from a depositing position (3) and for transfer into a transfer and/or measuring position (5) and back to a depositing position (3), wherein the gripping device (4) can be displaced linearly parallel to the x direction, is characterized in that the sample table (2) can be moved linearly parallel to a y direction, extending at an angle &agr; to the x direction, and independently of the gripping device (4) for gripping samples (1) from different lines, wherein the sample table (2) is disposed parallel to the x-y plane. The inventive X-ray analysis device can have very simple topological construction and facilitates a considerably more compact structure requiring considerably less space while maintaining full relative motion of the parts. Access to the depositing, transfer and measuring positions is not limited compared to a conven…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.