X-ray inspection system and method of operating
US6826255B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 26, 2003 |
| Grant date | Nov 30, 2004 |
| Priority date | — |
| Expiry date | Mar 26, 2023 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J35/24
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
An X-ray inspection system is provided comprising an X-ray source which includes an electron gun and beam steering means for alternately directing the electron beam from the gun in a first direction wherein the beam strikes the anode to produce a beam of X-rays which exits the X-ray source, and in a second direction wherein no significant X-ray flux exits the X-ray source. An X-ray detector and means for reading the detector are also provided. The beam steering means and the detector reading means are coordinated so that the detector output is read during a period when no significant X-ray flux exits the source. A method for operating the X-ray inspection system is also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.