Methods and apparatus for fluorescence and reflectance imaging and spectroscopy and for contemporaneous measurements of electromagnetic radiation with multiple measuring devices
US6826424B1 · kind B1 · utility
Inventors
Key dates
| Filing date | Dec 19, 2000 |
| Grant date | Nov 30, 2004 |
| Priority date | — |
| Expiry date | Oct 9, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/076
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and apparatus for contemporaneous measurements of electromagnetic radiation with multiple measuring devices, for producing a high diagnostic sensitivity image while achieving high diagnostic specificity with spectroscopy, for producing illumination for fluorescence/NIR reflectance imaging and white light reflectance imaging, all with the same sensors are disclosed. The method may involve selectively adjusting a gain of an imaging device in at least one wavelength band relative to a gain in at least one other band to produce an optimized image of an object, and may also involve producing a first reflectance signal in a first NIR wavelength band, and producing a second reflectance signal in a second NIR band such that an absorption coefficient ratio of oxyhemoglobin to deoxyhemoglobin in the second wavelength band differs from that in the first wavelength band, to permit the first and second reflectance signals to be used to produce a tissue oxygenation image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.