Shape based noise tolerance characterization and analysis of LSI
US6826736B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 10, 2003 |
| Grant date | Nov 30, 2004 |
| Priority date | — |
| Expiry date | Jan 10, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/367
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention presents techniques for considering whether the effects of cross-talk coupling and other noise exceed the noise tolerance of a circuit. One aspect of the present invention uses a set of parameters to represent this noise. An exemplary embodiment uses a triangle or trapezoidal approximation to a glitch based on a set of parameters: the peak voltage value, the width, the leading edge slope and the trailing edge slope. These values are then used as the input of a library to look up the corresponding noise tolerance parameter set values. In a variation, a set of formulae can provide the noise tolerance parameter set values. In an exemplary embodiment, the noise tolerance parameter set is taken to include the minimum peak value for the noise to be possibly harmful and the minimum width value for the noise to be possibly harmful.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.