Patent · US Expired

Systems and methods for wideband differential probing of variably spaced probe points

US6828768B2 · kind B2 · utility

21Cited by
7References
17Claims
0Family size

Assignee

Inventor

Key dates

Filing dateApr 16, 2002
Grant dateDec 7, 2004
Priority date—
Expiry dateSep 5, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/06738
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Systems and methods for wideband differential probing of variably spaced probe points are provided. One such embodiment includes a probe housing at least partially surrounding a first probe barrel and a second probe barrel. A first probe barrel end cap and a second probe barrel end cap extend respectively from the first and second probe barrels and also at least partially surround respectively a first probe tip and a second probe tip. The longitudinal axes of the first and second probe tips are offset respectively from the longitudinal axes of the first and second probe barrels. Methods are also provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.