Patent · US Expired

Method of and apparatus for measuring the correctness of and correcting an automatic test arrangement

US6829553B2 · kind B2 · utility

0Cited by
5References
36Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 30, 2001
Grant dateDec 7, 2004
Priority date
Expiry dateNov 11, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R35/005
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of and an apparatus for determining the correctness of the calibration of an automatic test arrangement and correcting errors in the automatic test arrangement. The electrical length is determined from the tester driver of the automatic test arrangement to the socket pin of the tester interface unit, from the tester driver to a grounding point of the device under test, from the tester driver to the tester interface unit, and with the tester interface unit output pin connected to ground by a shorting block from the tester driver through the shorting block ground. The difference between the first electrical length and the second electrical length is compared with the difference between the first electrical length and the third electrical length, and the result is evaluated to determine the correctness of the calibration of the automatic test arrangement.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.