Patent · US Expired

Systems and methods for discovering mutual dependence patterns

US6829608B2 · kind B2 · utility

16Cited by
6References
36Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 30, 2001
Grant dateDec 7, 2004
Priority date
Expiry dateApr 16, 2022

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S707/99942
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A new form of pattern is provided, referred to as a mutual dependence pattern or m-pattern. The m-pattern captures mutual dependence among a set of items. Intuitively, the m-pattern represents a set of items that often occur together. In our experience, such m-patterns often provide great values for certain tasks, such as event correlation in event management. Further, an efficient algorithm is provided for discovering all m-patterns in data for a given minimum mutual dependence threshold. Specifically, a linear algorithm is provided for testing whether a pattern is an m-pattern. Further, a pruning algorithm is provided that prunes the search space effectively. Still further, a level-wise algorithm for mining m-patterns is provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.