Patent · US Expired

Temperature measurement device

US6830373B2 · kind B2 · utility

0Cited by
15References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 13, 2003
Grant dateDec 14, 2004
Priority date
Expiry dateMay 13, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J5/064
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention relates to a temperature measurement device, particularly to a temperature measurement device for the cold junction of a non-contact temperature measurement element, characterized in that a plurality of electrical-conductive pins is provided on the bottom surface of a base. A sensor element for detecting object temperature and a heat-conductive elongated block are provided on the top surface of the base, the heat-conductive elongated block having a sensor element for detecting ambient temperature secured on the top surface thereof, wherein the heat capacity of the sensor element for detecting ambient temperature together with that of the heat-conductive elongated block will approximately be equal to that of the sensor element for detecting object temperature, such that the heat-balance constants of the sensor element for detecting ambient temperature and the cold junction of the sensor element for detecting object temperature will virtually coincide with each other at an abrupt temperature change. Consequently, the dynamic temperature difference between the sensor element for detecting ambient temperature and the cold junction of the sensor element for detecti…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.