Patent · US Expired

Method and apparatus for dicing released MEMS wafers

US6830990B1 · kind B1 · utility

15Cited by
1References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 7, 2002
Grant dateDec 14, 2004
Priority date
Expiry dateMar 11, 2023

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/78
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Various embodiments are methods and apparatuses for different steps in separating wafers into multiple wafer die. Some embodiments are adapted for dicing wafers having a front side and a back side, where the front side has processed devices, such as MEMS devices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.