Method for determining a tilt angle of an optical pickup head
US6831286B2 · kind B2 · utility
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3Claims
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Key dates
| Filing date | Feb 17, 2004 |
| Grant date | Dec 14, 2004 |
| Priority date | — |
| Expiry date | Feb 17, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B7/22
- WIPO fieldPharmaceuticals
- WIPO sectorChemistry
Abstract
A method for determining an emitting angle of an optical pickup head of an optical drive. A jitter inspection device comprises a jig, simulating and adjusting a tilt angle of the optical pickup head, and a jitter meter installed on the jig, inspecting jitter values at different tilt angles. A quadratic surface equation decreases the data points required for measurement to five, and enables product efficiency to raise 17% , such that the minimum jitter value and optimum tilt angle can be obtained quickly.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.