Patent · US Expired

Instruments and methods for examining and quantifying cataracts

US6834958B2 · kind B2 · utility

15Cited by
43References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 23, 2002
Grant dateDec 28, 2004
Priority date
Expiry dateOct 1, 2022

Classification

  • Technology area (CPC A)Human Necessities
  • CPC primaryA61B3/10
  • WIPO fieldMedical technology
  • WIPO sectorInstruments

Abstract

A method is disclosed for quantifying the extent a cataract impairs vision in an eye having a pupil, an ocular lens, and a retina. The method includes illuminating a localized region of the retina such that light is reflected from the localized region and is transmitted through the ocular lens. A portion of the reflected light is scattered by the cataract associated with the ocular lens. Light reflected from the localized region of the retina is collected, and the amount of scatter is measured so as to quantify the extent the scatter impairs vision of the eye.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.