Adverse condition detector having modulated test signal
US6836210B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 12, 2002 |
| Grant date | Dec 28, 2004 |
| Priority date | — |
| Expiry date | Nov 12, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG08B29/14
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
An adverse condition detect or that allows the user to test the apparatus in close proximity without having to endure full operational alarm activation. The adverse condition detector includes a detector, a transducer and a test system. When the detector senses an adverse condition, the transducer is activated to generate an alarm signal having an alarm level. When the test switch is activated, a test signal is generated at the alarm level and has a test duration that is substantially less than the duration of the alarm signal. In one embodiment of the invention, the alarm signal includes a plurality of alarm pulses having an alarm pulse duration and the test signal includes a plurality of test pulses each having a test pulse duration substantially less than the alarm pulse.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.