Method of and an arrangement for characterizing non-linear behavior of RF and microwave devices in a near matched environment
US6839657B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 23, 2002 |
| Grant date | Jan 4, 2005 |
| Priority date | — |
| Expiry date | Dec 11, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2822
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of and an arrangement for characterizing non-linear behavior of RF and microwave devices under test in a near matched environment. The method comprises the steps of exciting the device by an RF signal under different load conditions, measuring signal data at input and output ports of the device, verifying whether the measurement data meet predetermined quality criteria; calculating, from the measurement data, model parameters of a predetermined model for characterizing the non-linear behavior of the device, and verifying assumptions made in the characterization model by collecting additional measurement data and comparing same with data calculated from the model using the model parameters calculated. The load conditions are obtained by connecting to the output port of the device a matched load, an open, a short and a plurality of attenuators and delays.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.