Probe card apparatus and electrical contact probe having curved or sloping blade profile
US6842023B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 15, 2001 |
| Grant date | Jan 11, 2005 |
| Priority date | — |
| Expiry date | Jan 15, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06738
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe (1A) has a cutting blade portion (2) at a tip end that is brought into contact with a pad electrode (5). The cutting blade has a cutting edge that is in a plane parallel to the direction of sliding of the blade over a pad electrode, when the edge is brought into contact with the electrode. The cutting edge (2a) has a sloping or curved shape that comes closer to the electrode from the front side to the rear side of the blade along the direction of sliding. Thus, as the cutting edge (2a) cuts into an insulating coating (7) formed on the surface of the electrode, the probe ensures satisfactory electrical conduction between the probe (1A) and the electrode because it cuts through the coating without causing swarfs.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.