Patent · US Expired

Method and apparatus for detection and quantification of on-die voltage noise in microcircuits

US6842027B2 · kind B2 · utility

14Cited by
5References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 7, 2002
Grant dateJan 11, 2005
Priority date
Expiry dateOct 7, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R29/26
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An on-die noise detection circuit includes one or more voltage noise sensors, and one or more associated comparators. The voltage noise sensor includes a circuit including devices designed to position an initial voltage level of nodes between the devices at certain levels. The nodes are paired where the initial level of one node is above the initial level of the other node in the pair. The devices are designed to position the initial voltage levels of nodes of each pair such that the occurrence of noise above a predefined threshold voltage causes at least one of the voltage levels at the pair of nodes to approach and pass the other. The comparator monitors the voltage levels of each pair of nodes and generates a trigger signal upon detection of the voltage levels at a pair of nodes passing each other.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.