Device for a quantified determination of the quality of surfaces
US6842250B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 13, 2000 |
| Grant date | Jan 11, 2005 |
| Priority date | — |
| Expiry date | Nov 19, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/57
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a device and a method for determining the quality of surface. An illuminating light source radiates light at a predetermined angle onto the measurement surface. An optical detecting device receives the light reflected from said measurement surface and converts same into an electrical measurement signal. A processor controls the measurement sequence and evaluates the measurement results, which are emitted via an output device. The illuminating light source comprises at least one light-emitting diode. The light emitted comprises at least blue, green and red spectral components in the visible range of the spectrum. A filter is provided in the path of radiation between the light source and the photosensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.