Connection integrity monitor for digital selection circuits
US6842868B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 11, 2000 |
| Grant date | Jan 11, 2005 |
| Priority date | — |
| Expiry date | Jan 24, 2023 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04Q2213/13163
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A connection integrity monitor is provided wherein, for large switch fabrics (connection circuits), gate usage and power requirements are reduced by a value approaching 50% when compared to a previously disclosed connection integrity monitor. Rather than simultaneously monitoring the connectivity of all outputs of the switch fabric, thus completely duplicating the switch fabric, the connection integrity monitor monitors only one connection at a time. Therefore, redundancy is reduced from M to 1. The connection integrity monitor can be provisioned statically to monitor any one of the output connections or arranged so that all connections can be monitored, although not simultaneously.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.