Methods and apparatus for aligning components for inspection
US6842995B2 · kind B2 · utility
19Cited by
13References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 9, 2002 |
| Grant date | Jan 18, 2005 |
| Priority date | — |
| Expiry date | Mar 10, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B5/205
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for aligning a component including at least a first and a second datum for inspection. The method includes providing a tool including a fixture having at least a first and a second datum locator, aligning the first datum with the first datum locator, and rotating the component about the first datum to align the second datum with the second datum locator.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.