Quantitation of absorbed or deposited materials on a substrate that measures energy deposition
US6844543B2 · kind B2 · utility
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2References
45Claims
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Assignee
Inventors
Key dates
| Filing date | May 9, 2003 |
| Grant date | Jan 18, 2005 |
| Priority date | — |
| Expiry date | May 9, 2023 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/0409
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
This invention provides a system and method for measuring an energy differential that correlates to quantitative measurement of an amount mass of an applied localized material. Such a system and method remains compatible with other methods of analysis, such as, for example, quantitating the elemental or isotopic content, identifying the material, or using the material in biochemical analysis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.