Mass spectrometer for simultaneous detection of reflected and direct ions
US6844544B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 20, 2002 |
| Grant date | Jan 18, 2005 |
| Priority date | — |
| Expiry date | Sep 20, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/405
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Techniques for simultaneously detecting direct and reflected ions in a time-of-flight tube (120) and a source (110) for generating an ion beam of ions of a sample and introducing the ion beam into a first portion of the flight tube. A reflector (126) reflects ions from the ion beam in a second portion of the flight tube. A plate (140) substantially perpendicular to an axis of the ion beam is located between the first portion of the flight tube and the second portion of the flight tube. The plate has a hole through which some ions in the ion beam may pass from the first portion to the second portion of the flight tube. Each of two opposite faces of the plate includes a set of one or more ion detectors (140). The technique allows rapid, reliable detection of complex agents in a small number of samples.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.