Patent · US Expired

Multi-function opto-electronic detection apparatus

US6844935B2 · kind B2 · utility

3Cited by
4References
20Claims
0Family size

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Key dates

Filing dateJan 20, 2004
Grant dateJan 18, 2005
Priority date
Expiry dateJan 20, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B11/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A multi-function opto-electronic detection apparatus for detecting molecular characteristics of a test sample. The appratuses comprises functional mode subsystems including a detecting light source subsystem for generating sampling beams for illuminating the test sample; a manipulation optics subsystem for aligning the sampling beam onto the test sample; a target signal processing subsystem for analyzing target beams emerging from the test sample resulting from the illuminating of the sampling beam; and a sample fixation subsystem for holding the test sample. The detecting light source subsystem, manipulation optics subsystem and target signal processing subsystem are assembled into one of several possible optical sampling setups for the detection characteristics of the test sample. The functional mode setups include at least ellispometer, confocal image scanner, photon tunneling scanning microscope and interferometer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.