Patent · US Expired

Data processing system and method included within an oscilloscope for independently testing an input signal

US6845331B2 · kind B2 · utility

0Cited by
12References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 22, 2002
Grant dateJan 18, 2005
Priority date
Expiry dateNov 12, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R13/0263
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A data processing system and method included within an oscilloscope for independently analyzing a signal input into the oscilloscope. The oscilloscope includes a plurality of triggering modes. A plurality of trigger parameters are specified for each of the triggering modes. Thereafter, the oscilloscope automatically analyzes the input signal, independently from any user input, utilizing each of the triggering modes and the trigger parameters specified for each of the triggering modes. The input signal includes a desired waveform and a plurality of undesired waveforms. While the oscilloscope is automatically analyzing the input signal, a determination is made regarding whether the oscilloscope triggered on one of the undesired waveforms. When it is determined that the oscilloscope triggered on one of the undesired waveforms, the undesired waveform upon which the oscilloscope triggered is stored.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.