Patent · US Expired

Method for fabricating a silicon thin-film

US6846513B2 · kind B2 · utility

13Cited by
7References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 28, 2001
Grant dateJan 25, 2005
Priority date
Expiry dateDec 28, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02661
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Provided is a method of forming a silicon thin-film which comprises a step of arranging in one or more parts of a liquid arranging surface liquid which contains a silicide comprising ring silane and/or a derivative thereof, such ring silane comprising silicon and hydrogen, and a step of forming a silicon thin-film by vaporizing silicide from liquid and supplying the silicide to a thin-film-forming surface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.