Monitoring and correcting bragg gratings during their fabrication
US6847762B2 · kind B2 · utility
11Cited by
7References
54Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 2, 2002 |
| Grant date | Jan 25, 2005 |
| Priority date | — |
| Expiry date | Apr 25, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B6/02171
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
In accordance with some embodiments of the present invention, while a Bragg grating is being written in a substrate, measurements may be taken to allow changes to be made in the writing process to reduce errors that may occur in the written grating. In one embodiment, multiple scans of the writing beam can be used. After a scan, measurements of the characteristics of the grating being written can be taken and corrections may be implemented on subsequent scans.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.