Method and apparatus for calibrating detector spectral response
US6848827B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 13, 2003 |
| Grant date | Feb 1, 2005 |
| Priority date | — |
| Expiry date | May 13, 2023 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/583
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
The present technique provides for the spectral calibration of the detector elements of a CT detector using one or more offset calibration phantoms. The offset phantoms provide greater coverage of the detector elements as well as spectral response data associated with penetration lengths ranging in length from a minimum chord of the phantom to the diameter of the phantom. The spectral response as a function of penetration length can be obtained for each detector element by comparing the fitting of each projection view to the corresponding measured projection view over all view angles. The fitting information may then be employed to derive the coefficients of the spectral response curve for each detector element, which may in turn be employed to provide rapid correction of the spectral response for each element.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.